Deep Learning Approach for the Localization and Analysis of Surface Plasmon Scattering

Surface plasmon resonance microscopy (SPRM) combines the principles of traditional microscopy with the versatility of surface plasmons to develop label-free imaging methods. This paper describes a proof-of-principles approach based on deep learning that utilized the Y-Net convolutional neural network model to improve the detection and analysis methodology of SPRM. A machine-learning based image analysis technique was used to provide a method for the one-shot analysis of SPRM images to estimate scattering parameters such as the scatterer location. The method was assessed by applying the approach to SPRM images and reconstructing an image from the network output for comparison with the original image. The results showed that deep learning can localize scatterers and predict other variables of scattering objects with high accuracy in a noisy environment. The results also confirmed that with a larger field of view, deep learning can be used to improve traditional SPRM such that it localizes and produces scatterer characteristics in one shot, considerably increasing the detection capabilities of SPRM.