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Updated: Jul 13, 2025

Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle
Published on: January 3, 2016
Bo Kyung Cha1, Youngjin Lee2, Kyuseok Kim3
1Precision Medical Device Research Center, Korea Electrotechnology Research Institute (KERI), 111, Hanggaul-ro, Sangnok-gu, Ansan-si 15588, Gyeonggi-do, Republic of Korea.
This study introduces a novel method to enhance X-ray image quality by converting normal-thickness scintillator images to thin-thickness detector equivalents. The technique optimizes spatial resolution while minimizing noise and artifacts for improved diagnostic imaging.
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11:27Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2
Published on: December 8, 2016
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