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Updated: Jul 13, 2025

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Lorentz microscopy of optical fields.

John H Gaida1,2, Hugo Lourenço-Martins1,2, Sergey V Yalunin1,2

  • 1Department of Ultrafast Dynamics, Max Planck Institute for Multidisciplinary Sciences, 37077, Göttingen, Germany.

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|October 17, 2023
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Summary
This summary is machine-generated.

We developed Lorentz-PINEM, a new electron microscopy technique, to image nanoscale optical fields with high resolution. This method non-invasively maps the spatial phase of light fields, revealing complex optical modes on materials.

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Area of Science:

  • Electron microscopy
  • Nanoscale optics
  • Plasmonics

Background:

  • Electron energy loss and cathodoluminescence provide insights into nanoscale optical properties.
  • Photon-induced near-field electron microscopy (PINEM) uses stimulated scattering to imprint optical field information onto electron wave functions.

Purpose of the Study:

  • To introduce Lorentz-PINEM for full-field, non-invasive imaging of complex optical near fields.
  • To achieve high spatial resolution in mapping nanoscale optical properties.

Main Methods:

  • Utilizing stimulated scattering with external sample excitation.
  • Employing energy-filtered defocus phase-contrast imaging.
  • Applying iterative phase retrieval algorithms.

Main Results:

  • Successfully reconstructed the phase distribution of interfering surface-bound modes on a plasmonic nanotip.
  • Demonstrated the imprinting of spatial phase profiles from optical fields onto probing electrons.
  • Validated the technique for imaging complex optical near fields.

Conclusions:

  • Lorentz-PINEM offers a universal approach for retrieving spatially varying phase information of nanoscale fields.
  • The technique is capable of imaging topological modes with high resolution.
  • This method advances the study of light-matter interactions at the nanoscale.