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    An improved infrared nondestructive testing (NDT) method using long-pulse excitation enhances defect detection. This homogeneous pulse thermography (HPT) system offers improved heating and signal-to-noise ratio for reliable depth analysis.

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    Area of Science:

    • Materials Science
    • Non-Destructive Testing
    • Infrared Thermography

    Background:

    • Pulsed infrared non-destructive testing (NDT) faces challenges with uneven heating.
    • Improving signal-to-noise ratio is crucial for accurate defect detection.

    Purpose of the Study:

    • To propose an improved long-pulse excitation infrared NDT method.
    • To develop a homogeneous pulse thermography (HPT) system.
    • To enhance defect detection rate and quantitative analysis reliability.

    Main Methods:

    • Development of a novel long-pulse excitation system for infrared NDT.
    • Construction of a homogeneous pulse thermography (HPT) system.
    • Experimental analysis and comparison with traditional pulsed systems.

    Main Results:

    • Effective improvement in uniform heating during pulsed infrared NDT.
    • Significant enhancement of the signal-to-noise ratio in thermal images.
    • Demonstrated improvement in defect detection rate and depth analysis accuracy.

    Conclusions:

    • The improved pulsed infrared NDT system offers superior performance over traditional methods.
    • The HPT system effectively addresses uneven heating issues in infrared NDT.
    • Enhanced reliability for defect detection and quantitative depth analysis is achieved.