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Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.

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Related Experiment Video

Updated: Jul 1, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Nanometer flat blazed x-ray gratings using ion beam figure correction.

D L Voronov, T Wang, S Park

    Optics Express
    |October 20, 2023
    PubMed
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    Ion beam figuring (IBF) can correct x-ray grating surfaces to nanometer precision. This study demonstrates IBF preserves grating structure and diffraction efficiency, crucial for high-resolution x-ray optics.

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    Area of Science:

    • Optics
    • Surface Metrology
    • Nanotechnology

    Background:

    • Nanometer accuracy stitching interferometry enables high-performance ion beam figuring (IBF) of x-ray mirrors.
    • X-ray diffraction grating fabrication can introduce surface errors, degrading mirror figure quality.
    • Potential for ion beam smoothing to degrade grating structure and diffraction efficiency is a concern.

    Purpose of the Study:

    • Investigate post-production correction of x-ray diffraction gratings using IBF.
    • Evaluate the impact of IBF on grating structure and diffraction efficiency.
    • Assess the feasibility of achieving nanometer-level surface planarity while preserving grating integrity.

    Main Methods:

    • Utilized nanometer accuracy stitching interferometry for in-process feedback during IBF.
    • Applied ion beam figuring to correct figure errors on x-ray diffraction gratings.
    • Measured changes in grating structure and diffraction efficiency before and after IBF.

    Main Results:

    • Achieved nanometer-level planarity of the global grating surface using IBF.
    • Successfully preserved the grating structure during the ion beam correction process.
    • No detectable change in diffraction efficiency was observed after IBF.

    Conclusions:

    • IBF is a viable technique for correcting figure errors in x-ray diffraction gratings.
    • IBF can achieve high surface precision without compromising grating performance.
    • This method is critical for advancing ultra-high spectral resolution and maintaining brightness in coherent x-ray beams.