Simultaneous three-dimensional deformation measurement using tri-wavelength and monochrome camera imaging with a...

What we believe to be a new electronic speckle pattern interferometry (ESPI) configuration is being developed for simultaneous three-dimensional deformation measurements. In this ESPI system, two pairs of symmetrical illuminating arrangement with dual-wavelength lights were used to independently sense two in-plane deformation components, one Michelson interferometer-based set illuminating with the other wavelength light was utilized to measure out-of-plane deformation. The color speckle interferogram was split into four sub-patterns by a prism, three of them were filtered by three different bandpass dichroic filters and recorded by one monochrome camera. Micro-rotation testing work firstly verifies the validation of the proposed phase-shifting device. Three-dimensional deformation information was simultaneous obtained by using temporal phase-shift method. All strain components related to the specimen surface deformation were further determined by numerical differential. The experimental results of a tested specimen were excellently consistent with those of FEM simulation, which verified the validation and feasibility of the proposed ESPI system for measuring 3D deformation.