Jove
Visualize
Contact Us

Related Concept Videos

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

234
Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
234
Tandem Mass Spectrometry01:21

Tandem Mass Spectrometry

1.0K
Tandem mass spectrometry is a technique that uses multiple mass analyzers in series to obtain a higher selectivity and signal-to-noise ratio for the analyte. Instruments with multiple analyzers separated by an interaction cell enable secondary fragmentation and selected study of the fragment ions.
Secondary fragmentations occur in the interaction cell and can be induced by various factors. Fragmentation induced by collision with inert gases, such as N2, Ar, He, etc., is called collision-induced...
1.0K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same journal

Quantitative evaluation of surface crack depth based on wideband surface waves electromagnetic acoustic transducer.

The Review of scientific instruments·2026
Same journal

A tetrahedral probe constellation approach for measuring canonical momentum in self-organized laboratory plasma.

The Review of scientific instruments·2026
Same journal

High-precision and short duration operating time dispersion in a fast mechanical switch driven by an ultrasonic motor: Modeling, prediction, and compensation.

The Review of scientific instruments·2026
Same journal

Cluster assisted soft-landing hub (CLASH): An instrument for surface desorption and deposition using a pulsed cluster ion source.

The Review of scientific instruments·2026
Same journal

Influence of pre-ionization parameters on multi-channel discharge characteristics of field-distortion switch gaps.

The Review of scientific instruments·2026
Same journal

A Joule-Thomson low-temperature scanning tunneling microscope with vector magnet and rotatable scanning head.

The Review of scientific instruments·2026
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Video

Updated: Jul 12, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

9.7K

Single thermal scan digital system for deep level transient spectroscopy.

D Sreeshma1, K S R Koteswara Rao1

  • 1Department of Physics, Indian Institute of Science, Bangalore, Karnataka 560012, India.

The Review of Scientific Instruments
|October 20, 2023
PubMed
Summary
This summary is machine-generated.

A new micro-controller based Deep Level Transient Spectroscopy (DLTS) system, utilizing Arduino-Due, efficiently identifies semiconductor defects. This cost-effective and accurate system simplifies defect analysis, offering versatile applications.

More Related Videos

Rapid Scan Electron Paramagnetic Resonance Opens New Avenues for Imaging Physiologically Important Parameters In Vivo
08:01

Rapid Scan Electron Paramagnetic Resonance Opens New Avenues for Imaging Physiologically Important Parameters In Vivo

Published on: September 26, 2016

9.4K
Total Internal Reflection Absorption Spectroscopy TIRAS for the Detection of Solvated Electrons at a Plasma-liquid Interface
08:50

Total Internal Reflection Absorption Spectroscopy TIRAS for the Detection of Solvated Electrons at a Plasma-liquid Interface

Published on: January 24, 2018

13.8K

Related Experiment Videos

Last Updated: Jul 12, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

9.7K
Rapid Scan Electron Paramagnetic Resonance Opens New Avenues for Imaging Physiologically Important Parameters In Vivo
08:01

Rapid Scan Electron Paramagnetic Resonance Opens New Avenues for Imaging Physiologically Important Parameters In Vivo

Published on: September 26, 2016

9.4K
Total Internal Reflection Absorption Spectroscopy TIRAS for the Detection of Solvated Electrons at a Plasma-liquid Interface
08:50

Total Internal Reflection Absorption Spectroscopy TIRAS for the Detection of Solvated Electrons at a Plasma-liquid Interface

Published on: January 24, 2018

13.8K

Area of Science:

  • Materials Science
  • Electrical Engineering
  • Semiconductor Physics

Background:

  • Deep-level defects in semiconductors significantly impact device performance.
  • Traditional Deep Level Transient Spectroscopy (DLTS) systems can be complex and expensive.
  • Accurate characterization of these defects is crucial for semiconductor development.

Purpose of the Study:

  • To develop a novel, cost-effective, and user-friendly micro-controller based Deep Level Transient Spectroscopy (DLTS) system.
  • To implement advanced signal processing algorithms for defect identification.
  • To validate the system's performance using well-characterized semiconductor samples.

Main Methods:

  • Development of a DLTS system integrating Arduino-Due, a capacitance meter, and interface circuits.
  • Implementation of custom algorithms for digital control of filling pulse generation, data acquisition, and signal processing.
  • Fabrication and testing of gold-doped silicon p-n junction samples to verify system accuracy.

Main Results:

  • The micro-controller based DLTS system successfully identified deep-level defects in silicon.
  • Calculated defect parameters (energy, capture cross-section, concentration) showed good agreement with literature values.
  • The system demonstrated a minimum pulse width of 50 ns and high data acquisition resolution.

Conclusions:

  • The developed micro-controller based DLTS system offers a simple, inexpensive, and accurate solution for semiconductor defect analysis.
  • The system's digital control and efficient processing minimize errors and experimental time.
  • The versatility of the system is confirmed by its successful application to gold-doped silicon.