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In-Situ Pixel-wise Emissivity Measurement Using a Multispectral Infrared Camera
Corentin Poissenot-Arrigoni1, Bertrand Marcon1, Frédéric Rossi1
1Arts et Métiers Institute of Technology, LaBoMaP, UBFC, HESAM, F-71250 Cluny, France.
Accurate thermography requires precise emissivity determination. This study introduces a novel method using multispectral infrared cameras for direct, pixel-wise emissivity measurement during acquisition, eliminating costly traditional approaches.
Area of Science:
- Thermography and thermal imaging
- Material science and surface properties
Background:
- Accurate temperature measurement in thermography relies heavily on precise emissivity values.
- Traditional emissivity measurement methods are often time-consuming, expensive, and incompatible with real-time infrared image acquisition.
Purpose of the Study:
- To develop a novel method for determining pixel-wise emissivity.
- To enable simultaneous emissivity measurement during infrared camera acquisition.
- To eliminate the need for additional materials and experiments in emissivity assessment.
Main Methods:
- Utilizing data from a multispectral infrared camera.
- Developing algorithms to process multispectral data for emissivity calculation.
- Implementing a pixel-wise emissivity determination technique.
Main Results:
- Successful pixel-wise emissivity mapping was achieved.
- The method allows for direct emissivity measurement concurrently with infrared image capture.
- Elimination of the requirement for external calibration materials or separate experimental setups.
Conclusions:
- The presented method offers a significant advancement in thermography by enabling efficient and accurate emissivity determination.
- This technique simplifies the process of obtaining precise temperature measurements in various applications.
- The approach facilitates real-time emissivity assessment, enhancing the practicality of infrared thermography.
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