Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Biasing of FET01:22

Biasing of FET

289
Biasing a Junction Field Effect Transistor (JFET) is crucial for setting operational parameters and ensuring efficient functioning in electronic circuits. JFETs are characterized by using a single carrier type in N-channel or P-channel configurations, where the channel is surrounded by PN junctions. These junctions are central to the device's ability to control current flow.
In an N-channel JFET, the structure consists of N-type material forming the channel on a P-type substrate, with the...
289
Biasing of Metal-Semiconductor Junctions01:27

Biasing of Metal-Semiconductor Junctions

261
Biasing metal-semiconductor junctions involves applying a voltage across the junction. Specifically, the metal is connected to a voltage source, while the semiconductor is grounded. This technique is essential for controlling the direction and magnitude of current flow in electronic devices, including diodes, transistors, and photovoltaic cells.
In Schottky junctions, where the semiconductor is n-type, applying a positive voltage to the metal relative to the semiconductor reduces its Fermi...
261

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Dynamic adsorption behavior of bio-based adsorbent for multicomponent wastewater.

Journal of contaminant hydrology·2026
Same author

Isolation and Identification of Pathogens Associated with Fruit Rot of <i>Tamarindus</i><i>indica</i> L. and Screening for Their Biocontrol Agents.

Microorganisms·2026
Same author

Clade 2.3.4.4b H5N1 HPAIV from Migratory Birds in Beidaihe Wetland, North China.

Viruses·2026
Same author

Prediction of the Global Potential Distribution Area of <i>Phytopythium litorale</i> Based on the Maxent Model.

Biology·2026
Same author

Design, Synthesis, and Antitubercular Activity Evaluation of Novel Nitroimidazole Derivatives.

Journal of medicinal chemistry·2026
Same author

Value of Blood Count-Derived Inflammatory Markers for Evaluating Psoriasis Severity: Pilot Cross-Sectional Observational Study.

Interactive journal of medical research·2026
Same journal

Correction: Kang et al. Fluid Flow to Electricity: Capturing Flow-Induced Vibrations with Micro-Electromechanical-System-Based Piezoelectric Energy Harvester. <i>Micromachines</i> 2024, <i>15</i>, 581.

Micromachines·2026
Same journal

Femtosecond Laser Texturing of Wood Coatings with Bio-Based Epoxy and Wax Additives for Enhanced Hydrophobicity.

Micromachines·2026
Same journal

Engineering of Optoelectronic Devices for Renewable Energy Applications.

Micromachines·2026
Same journal

Phase Transformation and Electrochemical Behavior of Hexagonal TiO<sub>2</sub> Nanotubes Under Different Annealing Temperatures and Heating Rates.

Micromachines·2026
Same journal

Process Optimization and Predictive Modeling of Femtosecond Laser Precision Milling for Commercial PMMA Slices.

Micromachines·2026
Same journal

A Hybrid Preprocessing Multi-Objective Surrogate Model for Thermal MEMS Actuators.

Micromachines·2026
See all related articles

Related Experiment Video

Updated: Jul 12, 2025

Silicon Metal-oxide-semiconductor Quantum Dots for Single-electron Pumping
14:58

Silicon Metal-oxide-semiconductor Quantum Dots for Single-electron Pumping

Published on: June 3, 2015

14.7K

A Fast Simulation Method for Evaluating the Single-Event Effect in Aerospace Integrated Circuits.

Xiaorui Zhang1, Yi Liu1, Changqing Xu1,2

  • 1Laboratory of Digital IC and Space Application, School of Microelectronics, Xidian University, Xi'an 710071, China.

Micromachines
|October 28, 2023
PubMed
Summary
This summary is machine-generated.

This study introduces an improved multi-point fault injection method to enhance the simulation efficiency of single-event effects (SEE) in aerospace integrated circuits. The new approach accelerates testing by verifying multiple faults in a single workload execution, improving reliability assessments.

Keywords:
aerospace integrated circuitsgrouping methodmulti-point fault injection methodsingle-event effect

More Related Videos

Real-Time DC-dynamic Biasing Method for Switching Time Improvement in Severely Underdamped Fringing-field Electrostatic MEMS Actuators
11:44

Real-Time DC-dynamic Biasing Method for Switching Time Improvement in Severely Underdamped Fringing-field Electrostatic MEMS Actuators

Published on: August 15, 2014

10.4K
Laser-induced Forward Transfer for Flip-chip Packaging of Single Dies
08:21

Laser-induced Forward Transfer for Flip-chip Packaging of Single Dies

Published on: March 20, 2015

12.4K

Related Experiment Videos

Last Updated: Jul 12, 2025

Silicon Metal-oxide-semiconductor Quantum Dots for Single-electron Pumping
14:58

Silicon Metal-oxide-semiconductor Quantum Dots for Single-electron Pumping

Published on: June 3, 2015

14.7K
Real-Time DC-dynamic Biasing Method for Switching Time Improvement in Severely Underdamped Fringing-field Electrostatic MEMS Actuators
11:44

Real-Time DC-dynamic Biasing Method for Switching Time Improvement in Severely Underdamped Fringing-field Electrostatic MEMS Actuators

Published on: August 15, 2014

10.4K
Laser-induced Forward Transfer for Flip-chip Packaging of Single Dies
08:21

Laser-induced Forward Transfer for Flip-chip Packaging of Single Dies

Published on: March 20, 2015

12.4K

Area of Science:

  • Electrical Engineering
  • Computer Science

Background:

  • Integrated circuit technology advancements necessitate robust reliability assessments for aerospace applications.
  • Single-event effects (SEE) pose a significant threat to the integrity of aerospace integrated circuits.
  • Traditional fault injection simulations are inefficient due to masking effects and the one-fault-per-execution approach.

Purpose of the Study:

  • To enhance the efficiency of simulating single-event effects (SEE) in aerospace integrated circuits.
  • To address the limitations of traditional and general multi-point fault injection methods.
  • To develop a method that accurately identifies error-causing faults even with multiple injections.

Main Methods:

  • Proposed an improved multi-point fault injection technique for computer simulations.
  • Implemented a workload execution strategy that allows for multiple fault injections per run.
  • Developed a fault grouping mechanism to pinpoint specific error-inducing faults when errors occur.

Main Results:

  • The improved method significantly accelerates simulation processes.
  • Successfully verified multiple faults within a single workload execution.
  • Enabled accurate identification of faults responsible for errors through the grouping method.

Conclusions:

  • The proposed multi-point fault injection method offers a substantial acceleration effect for SEE simulations.
  • This technique effectively overcomes the inefficiency and ambiguity issues of previous fault injection strategies.
  • The improved method enhances the reliability analysis of aerospace integrated circuits by increasing simulation efficiency.