You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jul 22, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Jacek M Grochowalski1, Tomasz Chady1
1Faculty of Electrical Engineering, West Pomeranian University of Technology in Szczecin, 70-313 Szczecin, Poland.
This study uses Pulsed Multifrequency Excitation and Spectrogram Eddy Current Testing (PMFES-ECT) with k-Nearest Neighbors (k-NN) to accurately estimate defect parameters in conductive materials.
11:34Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
Published on: May 15, 2017
06:17Quantifying the Relative Thickness of Conductive Ferromagnetic Materials Using Detector Coil-Based Pulsed Eddy Current Sensors
Published on: January 16, 2020
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: