Low-Permittivity and Low-Temperature Cofired BaSO4-BaF2 Microwave Dielectric Ceramics for High-Reliability Packaged

Wei Wang1, Muhammad Shehbaz1, Xin Wang1

  • 1Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an 710049, Shaanxi China.

PubMed
Summary

This study introduces a new ceramic material, BaSO4-BaF2, for use in high-reliability packaged electronics. The material has a coefficient of thermal expansion (CTE) that matches solders and laminates, reducing the risk of mechanical stress during heating. It also has a low permittivity and high quality factor, making it suitable for microwave applications. The researchers tested the material by fabricating a resonant antenna and found it performed well with a high radiation efficiency. They also used simulations to confirm that the material works well with other components in a packaged system. This ceramic could replace traditional low-temperature cofired ceramics in certain applications.

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