Atomic Force Microscopy
Interfacial Electrochemical Methods: Overview
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Andrea Auer1, Bernhard Eder1, Franz J Giessibl1
1Institute of Experimental and Applied Physics, University of Regensburg, 93053 Regensburg, Germany.
This study presents a new instrument combining atomic force microscopy (AFM) and scanning tunneling microscopy (STM) for electrochemical interfaces. It achieves atomic resolution imaging and measures solvent layering in acidic electrolytes.
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