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This study introduces a new metric for quantum reliability, moving beyond state fidelity to analyze quantum trajectories. This framework offers a universal approach to assessing the reliability of both classical and quantum devices.

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Area of Science:

  • Quantum Physics
  • Reliability Engineering
  • Quantum Information Science

Background:

  • Quantum technology advancements necessitate robust reliability assessments for quantum devices.
  • Existing classical reliability theory lacks metrics suitable for quantum systems.
  • Quantum fidelity does not fully capture reliability loss influenced by quantum processes.

Purpose of the Study:

  • To develop a systematic metric for quantum reliability and its loss.
  • To establish a universal framework for reliability theory applicable to both classical and quantum devices.
  • To provide a new perspective on quantum engineering by linking device performance to quantum processes.

Main Methods:

  • Shifting the focus from quantum state distinguishing to quantum trajectory distinguishing for reliability assessment.
  • Grounding quantum reliability in quantum probability amplitude or wave function, rather than classical binary variables.
  • Developing a universal framework for reliability theory.

Main Results:

  • A novel metric for quantum reliability has been established.
  • The proposed metric focuses on the distinctiveness of quantum trajectories.
  • A universal framework encompassing classical and quantum reliability is presented.

Conclusions:

  • The new quantum reliability metric offers a more accurate assessment than quantum fidelity alone.
  • This research provides a foundational framework for understanding and engineering reliable quantum devices.
  • Understanding the influence of real quantum processes is crucial for device performance.