Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

3.4K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.4K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Isomorphic contact resonance force microscopy and piezoresponse force microscopy of an AlN thin film: demonstration of a new contact resonance technique.

Nano futures·2026
Same author

Experimental validation of contact resonance AFM using long massive tips.

Nanotechnology·2023
Same journal

AFM-Modified Graphene Field-Effect Transistor for Sensitive Detection of Cardiac Troponin I.

Nanotechnology·2026
Same journal

Ultra-Sensitive UV Photodetectors Enabled by Built-in Electric Fields in Hierarchical NP-Type Porous Silicon.

Nanotechnology·2026
Same journal

Effect of sintering temperature on structural, microstructural and magnetic properties of La<sub>0.8</sub>Sr<sub>0.2</sub>MnO<sub>3</sub>: Evolution of faceting and terrace like morphology.

Nanotechnology·2026
Same journal

Engineered V2C MXene Anchored Cu Nanoparticles for Selective Nitrate/Nitrite Sensing and Magneto-Electrocatalytic Hydrogen Evolution Reaction.

Nanotechnology·2026
Same journal

Quantitative Mechanism Separation of Single-Event Transients in Nanosheet Transistors via TCAD Simulation.

Nanotechnology·2026
Same journal

Antibacterial, mechanical and curing properties of PMMA bone cement loaded with copper nanoparticles.

Nanotechnology·2026
See all related articles

Related Experiment Video

Updated: Jul 11, 2025

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

3.0K

Contact resonance atomic force microscopy using long elastic tips.

Nadav Zimron-Politi1, Ryan C Tung1

  • 1Department of Mechanical Engineering, University of Nevada, Reno, 1664 N. Virginia St., Reno, NV 89557-0312, United States of America.

Nanotechnology
|November 10, 2023
PubMed
Summary
This summary is machine-generated.

A new theoretical model for contact resonance atomic force microscopy (AFM) accurately predicts sample stiffness using an L-shaped beam model. This model enhances understanding of dynamic phenomena and has applications in micro-systems.

Keywords:
atomic force microscopycontact resonancelong elastic tipnano-needleqPlus sensor

More Related Videos

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

16.7K
High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
08:59

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

799

Related Experiment Videos

Last Updated: Jul 11, 2025

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

3.0K
Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

16.7K
High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
08:59

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

799

Area of Science:

  • Physics
  • Materials Science
  • Mechanical Engineering

Background:

  • Contact resonance atomic force microscopy (AFM) is a key technique for material characterization.
  • Existing models may not fully capture the complex elastic dynamics of AFM sensing tips.
  • Understanding tip-sample interactions is crucial for high-resolution imaging and property mapping.

Purpose of the Study:

  • To develop a novel theoretical model for contact resonance AFM.
  • To incorporate the elastic dynamics of a long sensing tip, specifically an 'L-shaped' beam.
  • To enable high-accuracy prediction of sample stiffness and analyze dynamic phenomena.

Main Methods:

  • Utilized the Euler-Bernoulli beam theory to model the sensing tip.
  • Incorporated coupling effects of the two-beam structure, forming an L-shaped beam.
  • Analyzed multiple vibration modes to predict sample stiffness and dynamic behaviors.

Main Results:

  • Achieved high-accuracy prediction of sample stiffness with a relative error below 10% for practical ranges.
  • Demonstrated the model's capability to predict eigenmode veering and crossing phenomena.
  • Validated the theoretical framework for contact resonance AFM simulations.

Conclusions:

  • The developed L-shaped beam model provides a significant advancement in contact resonance AFM.
  • The model accurately predicts sample stiffness and reveals complex dynamic interactions.
  • The theoretical framework has potential applications beyond AFM, including MEMS and energy harvesting.