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Updated: Jul 11, 2025

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Comparison of adaptive optical scanning holography based on new evaluation methods
Jilu Duan1, Yaping Zhang2, Yongwei Yao1
1Yunnan Provincial Key Laboratory of Modern Information Optics (LMIO), Kunming University of Science and Technology, Kunming, 650500, Yunnan, China.
Abstract:
Adaptive Optical Scanning Holography (AOSH) represents a powerful technique that employs an adaptive approach to selectively omit certain lines within holograms, guided by the utilization of Normalized-Mean-Error (NME) as a predictive measure. This approach effectively diminishes scanning time and conserves the storage space required for data preservation. However, there exists alternative methods superior to NME in terms of evaluating the model's efficacy. This paper introduces two novel methods, namely Normalized-Root-Mean-Square-Error (NRMSE) and Normalized-Mean-Square-Error (NMSE), into the AOSH system, leading to the development of NRMSE-AOSH and NMSE-AOSH. These new systems aim to further minimize duration of holographic recording. Through a comparative analysis of hologram lines between the two newly proposed AOSH systems and the original AOSH, we demonstrate that both NRMSE-AOSH and NMSE-AOSH effectively reduce the number of hologram lines while maintaining the hologram's informational content. Among the three methods, our two new methods exhibit better performance compared with the original method.

