Surface Roughness-Induced Changes in Important Physical Features of CoFeSm Thin Films on Glass Substrates during...

Area of Science:

• Materials Science
• Thin Film Technology
• Nanotechnology

Background:

• CoFeSm thin films are investigated for their potential applications.
• Understanding the influence of processing parameters on film properties is crucial.

Purpose of the Study:

• To analyze the structural, magnetic, electrical, nanomechanical, adhesive, and optical properties of CoFeSm thin films.
• To determine the effects of film thickness and annealing temperature on these properties.

Main Methods:

• Deposition of Co60Fe20Sm20 thin films (10-50 nm) onto glass substrates via high vacuum evaporation.
• Annealing treatments at room temperature (RT), 100, 200, and 300 °C.
• Characterization using X-ray diffraction (XRD), electrical measurements, Atomic Force Microscopy (AFM), nanoindentation, contact angle, and transmittance spectroscopy.

Main Results:

• XRD showed amorphous structures; electrical resistivity decreased with thickness and annealing.
• AFM revealed decreased surface roughness with increased thickness and annealing.
• Magnetic susceptibility (χac) increased with thickness and annealing.
• Hardness and Young's modulus decreased with thickness; films were hydrophilic with increased surface energy.
• Transmittance decreased with increased thickness due to enhanced absorption.

Conclusions:

• Surface roughness significantly impacts magnetic, electrical, adhesive, and optical properties of CoFeSm films.
• Smoother surfaces enhance magnetic susceptibility and electrical conductivity while reducing optical transparency and contact angles.
• Annealing temperature and film thickness are critical factors controlling the properties of CoFeSm thin films.