Scanning Electron Microscopy
Overview of Microscopy Techniques
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Updated: Jul 11, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Kim Sang Tran1, Bijan Shirinzadeh1, Armin Ehrampoosh1
1Robotics and Mechatronics Research Laboratory (RMRL), Department of Mechanical and Aerospace Engineering, Monash University, Melbourne, VIC 3800, Australia.
This study introduces an Eddy current method for detecting micro surface defects in steel filaments. The technique accurately identifies cracks and inclusions, crucial for quality control in advanced manufacturing.
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