Band Theory
Biasing of Metal-Semiconductor Junctions
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Updated: Jul 11, 2025

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
Michael Rodriguez-Fano1, Mohamad Haydoura1, Julien Tranchant1
1Institut des Matériaux Jean Rouxel, IMN, Université de Nantes, CNRS, F-44000 Nantes, France.
This study explores V-substituted Cr2O3 for advanced nonvolatile memory. Tuning V content in (Cr1-xVx)2O3 solid solutions significantly enhances memory window performance, confirming potential for correlated insulator memory applications.
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