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Universal interface fluctuations in the contact process.

B G Barreales1, J J Meléndez1,2, R Cuerno3

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Summary
This summary is machine-generated.

We investigated the anomalous interface behavior in contact processes at critical points. Our study reveals complex scaling properties beyond standard models, offering new insights into surface kinetic roughening.

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Area of Science:

  • Statistical Physics
  • Complex Systems
  • Surface Science

Background:

  • The contact process exhibits critical phenomena relevant to various physical systems.
  • Surface kinetic roughening describes the evolution of rough surfaces over time.
  • Standard dynamic scaling models, like the Family-Vicsek Ansatz, may not capture all critical interface behaviors.

Purpose of the Study:

  • To characterize the kinetic roughening universality class of the contact process interface at its directed-percolation critical point.
  • To investigate anomalous scaling properties deviating from standard models.
  • To analyze interface fluctuations using probability density functions (PDF) and covariance.

Main Methods:

  • Numerical study expanding on previous work.
  • Analysis of interface dimensions for d=1, 2, and 3.
  • Characterization of scaling exponents, PDF, and covariance of interface fluctuations.

Main Results:

  • The interface scaling properties are intrinsically anomalous and more complex than predicted by the Family-Vicsek Ansatz.
  • Interface fluctuations display universal properties qualitatively similar to Kardar-Parisi-Zhang (KPZ) and other classes.
  • For d=1, interface covariance aligns with KPZ, Airy_{1} covariance, but PDF and scaling exponents do not.

Conclusions:

  • The contact process interface at criticality represents a complex kinetic roughening universality class.
  • While some fluctuation properties resemble KPZ, quantitative agreement is limited, highlighting the anomalous nature.
  • Further research is needed to fully understand the deviations in PDF and scaling exponents.