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Published on: June 18, 2021
Hyperspectral screen-image-synthesis meter with scattering-noise suppression.
Yeh-Wei Yu1,2, Ming Le1, Tsung-Hsun Yang1,2
1Department of Optics and Photonics, National Central University, Chung-Li, Taoyuan, 320317, Taiwan.
This study introduces a novel screen image synthesis (SIS) hyperspectral meter that integrates snapshot hyperspectral technology. This enhanced system overcomes stray light noise and enables spectrum measurement for improved material analysis.
Area of Science:
- Optical Engineering
- Spectroscopy
- Material Science
Background:
- The original screen image synthesis (SIS) meter offered high-speed, whole-field measurements by fusing data from multiple sample-rotational angles.
- However, the initial SIS meter was limited by stray light noise and lacked spectral measurement capabilities.
Purpose of the Study:
- To develop an improved SIS system incorporating snapshot hyperspectral technology to address limitations of the original design.
- The goal was to create a hyperspectral meter capable of accurate spectrum and color temperature coefficient measurements while mitigating stray light noise.
Main Methods:
- A sparse sampling screen (SSS) based dispersion image was integrated into the SIS system.
- Hyperspectral data was captured at various sample-rotational angles and then fused to generate whole-field hyperspectral data.
- The system's accuracy was validated by comparing its hyperspectral values and 2D color temperature coefficient distribution with a one-dimensional spectrum goniometer (ODSG).
Main Results:
- The proposed SIS system successfully produced whole-field hyperspectral data and effectively reduced stray-light noise.
- Experimental comparisons confirmed the correctness of the hyperspectral values obtained.
- The system demonstrated accurate 2D color temperature coefficient distribution, comparable to ODSG measurements.
Conclusions:
- The integration of snapshot hyperspectral technology with SSS has resulted in a functional screen image synthesis hyperspectral meter.
- This novel system overcomes the limitations of previous SIS meters, offering enhanced spectral measurement capabilities and noise reduction.
- The study validates the feasibility of the developed meter for both spectrum distribution and color temperature coefficient measurements.
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