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Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range

Stanislav Tyaginov1, Erik Bury1, Alexander Grill1

  • 1Imec, Kapeldreef 75, 3001 Leuven, Belgium.

Micromachines
|November 25, 2023
PubMed

Keywords:
carrier transportcompact physics modelhot-carrier degradationimpact ionizationinterface trapssecondary carriers

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