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Updated: Jul 10, 2025

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Published on: April 16, 2017
Accel Abarca1,2, Albert Theuwissen1,3
1EWI Faculty, Electronic Instrumentation Laboratory, Delft University of Technology, Mekelweg 4, 2628 CD Delft, The Netherlands.
This study introduces a new method for compensating dark current in CMOS image sensors (CIS) using in-pixel temperature sensors (IPTS). This technique effectively reduces dark signal and non-uniformity across a wide temperature range.
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