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Multi-view stitching phase measuring deflectometry for freeform specular surface metrology.

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    This summary is machine-generated.

    This study introduces multi-view stitching phase measuring deflectometry (PMD) to accurately measure complex specular surfaces. The novel approach overcomes limitations of traditional PMD for freeform optics and curved displays.

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    Area of Science:

    • Optical Metrology
    • Surface Inspection
    • Freeform Optics Measurement

    Background:

    • Phase measuring deflectometry (PMD) is valuable for specular surface inspection.
    • High local slopes on freeform surfaces cause ray dispersion, challenging traditional PMD.

    Purpose of the Study:

    • To develop a multi-view stitching PMD system for accurate measurement of freeform specular surfaces.
    • To overcome the limitations of single-view PMD in handling high local slopes and ray dispersion.

    Main Methods:

    • Utilized multiple sensors and a screen to capture regional surface appearances.
    • Implemented precise system calibration to correct absolute depth for each region.
    • Stitched regional appearances to reconstruct the complete 3D surface morphology.

    Main Results:

    • Achieved a measurement accuracy of 5.3 µm (0.18% relative error) for a spherical lens (PV 2.9 mm).
    • Successfully measured a curved mobile phone screen with local slopes from -46.1° to 51.3°.
    • Measured a freeform acrylic sheet (PV 5.3 mm) with local slopes from -6.7° to 7.7°.

    Conclusions:

    • Multi-view stitching PMD effectively reconstructs complex specular surfaces.
    • The proposed method enhances accuracy and applicability for freeform optics and curved displays.