Extraordinary-log Universality of Critical Phenomena in Plane Defects

The recent discovery of the extraordinary-log (E-Log) criticality is a celebrated achievement in modern critical theory and calls for generalization. Using large-scale Monte Carlo simulations, we study the critical phenomena of plane defects in three- and four-dimensional O(n) critical systems. In three dimensions, we provide the first numerical proof for the E-Log criticality of plane defects. In particular, for n=2, the critical exponent q[over ^] of two-point correlation and the renormalization-group parameter α of helicity modulus conform to the scaling relation q[over ^]=(n-1)/(2πα), whereas the results for n≥3 violate this scaling relation. In four dimensions, it is strikingly found that the E-Log criticality also emerges in the plane defect. These findings have numerous potential realizations and would boost the ongoing advancement of conformal field theory.