Self-Referenced Spectral Interferometry for Single-Shot Characterization of Ultrashort Free-Electron Laser Pulses

An attosecond x-ray pulse with known spectrotemporal information is an essential tool for the investigation of ultrafast electron dynamics in quantum systems. Ultrafast free-electron lasers (FELs) have the unique advantage on unprecedented high intensity at x-ray wavelengths. However, no suitable method has been established so far for the spectrotemporal characterization of these ultrashort x-ray pulses. In this Letter, a simple method has been proposed based on self-referenced spectral interferometry for reconstructing the temporal profile and phase of ultrashort FEL pulses. We have demonstrated that the proposed method is reliable to completely characterize the attosecond x-ray FEL pulses with an error at the level of a few percent. Moreover, the first proof-of-principle experiment has been performed to achieve the single-shot spectrotemporal characterization of ultrashort pulses from a high-gain FEL. The precision of the proposed method will be enhanced with the decrease of the pulse duration, paving a new way for complete attosecond pulse characterization at x-ray FELs.