Related Experiment Video
Updated: Jul 9, 2025
Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Pixel-wise beam-hardening correction for dark-field signal in X-ray dual-phase grating interferometry
Beam hardening in X-ray grating interferometry obscures structural details. This study introduces a correction algorithm to recover quantitative sub-resolution information, enabling access to small-angle scattering data.
Area of Science:
- Physics
- Materials Science
- Imaging Science
Background:
- X-ray grating interferometry provides dark-field signals for macroscopic structural analysis.
- Polychromatic X-rays cause beam hardening, limiting quantitative sub-resolution structural information retrieval.
- Beam hardening in dual-phase grating interferometry is complex, varying with spatial parameters.
Purpose of the Study:
- To develop a beam-hardening correction algorithm for dual-phase X-ray grating interferometry.
- To enable quantitative retrieval of sub-resolution structural information.
- To facilitate access to small-angle scattering data.
Main Methods:
- Proposed a novel beam-hardening correction algorithm.
- Accounted for spatial location, inter-grating distance, and diffraction order variations.
- Validated the algorithm's accuracy and robustness through experimental results.
Main Results:
- Successfully corrected beam-hardening effects in the dark-field signal.
- Demonstrated the algorithm's accuracy and robustness.
- Enabled quantitative analysis of sub-resolution structural information.
Conclusions:
- The developed algorithm is a crucial step for quantitative analysis in dual-phase grating interferometry.
- This method unlocks access to small-angle scattering information previously obscured by beam hardening.
- Advances structural imaging capabilities in X-ray grating interferometry.
More Related Videos
08:39Shaping the Amplitude and Phase of Laser Beams by Using a Phase-only Spatial Light Modulator
Published on: January 28, 2019
06:49In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation
Published on: March 2, 2021
Related Concept Videos
01:26Phase Contrast and Differential Interference Contrast Microscopy
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
02:18X-ray Crystallography
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...