A mini scanning device for profiling charged beams

Area of Science:

• Particle accelerators and beam physics
• Imaging and tomography techniques
• Charged particle beam characterization

Background:

• Accurate characterization of charged particle beams is crucial for accelerator performance.
• Traditional beam profiling methods can be limited in resolution or scope.
• Developing novel, non-invasive techniques is essential for advanced beam diagnostics.

Purpose of the Study:

• To present the development of a novel mini scanner device.
• To utilize computed tomography for full transverse spatial density characterization of charged particle beams.
• To demonstrate the device's capability in monitoring beam focusing and deflection.

Main Methods:

• A wire scanner mounted on a rotating linear translator was employed.
• Computed tomography reconstruction algorithms were applied to the scanned data.
• Tests were conducted on a millimeter electron beam with 200 eV energy and 100 nA intensity.

Main Results:

• The mini scanner successfully characterized the transverse spatial density of the electron beam.
• The device provided detailed profiles, enabling effective monitoring of beam parameters.
• The system demonstrated control and monitoring capabilities for both beam focusing and deflection.

Conclusions:

• The developed mini scanner is an effective tool for charged particle beam characterization.
• Computed tomography offers a powerful approach for reconstructing detailed beam density profiles.
• This technology advances beam diagnostics, supporting precise control in particle accelerator applications.