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Scanning-probe Single-electron Capacitance Spectroscopy
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A mini scanning device for profiling charged beams.

P Moretto-Capelle1, E Panader1, L Polizzi1

  • 1Laboratoire Collisions Agrégats et Réactivité (LCAR), UMR5589 Université de Toulouse (UPS) and CNRS, 118 Route de Narbonne, F-31062 Toulouse, France.

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We developed a mini scanner using computed tomography to measure charged particle beam density. This device precisely maps electron beam profiles, aiding in focusing and deflection control.

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Area of Science:

  • Particle accelerators and beam physics
  • Imaging and tomography techniques
  • Charged particle beam characterization

Background:

  • Accurate characterization of charged particle beams is crucial for accelerator performance.
  • Traditional beam profiling methods can be limited in resolution or scope.
  • Developing novel, non-invasive techniques is essential for advanced beam diagnostics.

Purpose of the Study:

  • To present the development of a novel mini scanner device.
  • To utilize computed tomography for full transverse spatial density characterization of charged particle beams.
  • To demonstrate the device's capability in monitoring beam focusing and deflection.

Main Methods:

  • A wire scanner mounted on a rotating linear translator was employed.
  • Computed tomography reconstruction algorithms were applied to the scanned data.
  • Tests were conducted on a millimeter electron beam with 200 eV energy and 100 nA intensity.

Main Results:

  • The mini scanner successfully characterized the transverse spatial density of the electron beam.
  • The device provided detailed profiles, enabling effective monitoring of beam parameters.
  • The system demonstrated control and monitoring capabilities for both beam focusing and deflection.

Conclusions:

  • The developed mini scanner is an effective tool for charged particle beam characterization.
  • Computed tomography offers a powerful approach for reconstructing detailed beam density profiles.
  • This technology advances beam diagnostics, supporting precise control in particle accelerator applications.