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Updated: Jul 9, 2025

Scanning-probe Single-electron Capacitance Spectroscopy
Published on: July 30, 2013
A mini scanning device for profiling charged beams
P Moretto-Capelle1, E Panader1, L Polizzi1
1Laboratoire Collisions Agrégats et Réactivité (LCAR), UMR5589 Université de Toulouse (UPS) and CNRS, 118 Route de Narbonne, F-31062 Toulouse, France.
Abstract:
In this article, we present the development of a mini scanner device to characterize the full transverse spatial density of a charged particle beam using computed tomography. The profiler consists of a wire mounted on a linear translator that can rotate around the beam. Tests were performed on a millimeter electron beam with 200 eV energy and 100 nA intensity, which allowed us to control and monitor both beam focusing and deflection.
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