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Updated: Sep 5, 2026

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)
10:42

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)

Published on: June 16, 2016

[The microstructural analysis of scintigrams]

V I Vidiukov, Iu N Kasatkin, V V Mit'kov

    Meditsinskaia Radiologiia
    |February 1, 1987
    PubMed

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