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Fast and robust Fourier ptychographic microscopy with position misalignment correction.

Zicong Luo1, Ruofei Wu1, Hanbao Chen1

  • 1Foshan University, School of Physics and Optoelectronic Engineering, Foshan, China.

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|December 11, 2023
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Summary

This study introduces an improved algorithm for Fourier ptychographic microscopy (FPM) to correct LED array misalignment. The new method enhances reconstruction efficiency and robustness, crucial for high-resolution imaging.

Keywords:
Fourier ptychographic microscopyLED position misalignment correctionphase retrieval

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Area of Science:

  • Computational imaging
  • Optical microscopy
  • Image reconstruction

Background:

  • Fourier ptychographic microscopy (FPM) enables simultaneous wide-field, high-resolution quantitative phase imaging.
  • Accurate LED array positioning is critical for FPM image quality, but misalignment poses a significant challenge.
  • Existing LED position correction algorithms in FPM require improvements in efficiency and robustness.

Purpose of the Study:

  • To develop an improved position misalignment correction method for LED arrays in FPM.
  • To enhance the reconstruction efficiency and robustness of FPM systems facing LED position errors.

Main Methods:

  • Proposed an adaptive annealing-based correction (AA-C) algorithm for LED position misalignment.
  • Implemented an improved phase recovery strategy with an optimized spectrum function update, incorporating an adaptive control factor.
  • Utilized simulated annealing (SA) principles for position correction.

Main Results:

  • The AA-C algorithm demonstrated effectiveness and robustness in correcting LED array position misalignment in FPM.
  • Achieved significant improvements in convergence speed: 21.2% over SC-FPM and 54.9% over PC-FPM.
  • Experimental validation confirmed the proposed method's performance.

Conclusions:

  • The developed AA-C algorithm effectively addresses LED array misalignment in FPM.
  • The method reduces system requirements for LED array accuracy and enhances overall robustness.
  • Improved reconstruction efficiency contributes to more practical FPM applications.