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Updated: Jul 8, 2025

Additive Manufacturing-Enabled Low-Cost Particle Detector
Published on: March 24, 2023
Position-sensitive non-destructive detection of charged-particle bunches in low-energy beamlines
Stefan Ringleb1, Markus Kiffer2, Jonas K C Ballentin2,3
1Friedrich Schiller-Universität Jena, 07743, Jena, Germany. stefan.ringleb@uni-jena.de.
Abstract:
We have developed and operated an electronic detection system for the non-destructive single-pass detection of bunches of charged particles in a beamline that allows for a measurement of their lateral position with respect to the central beamline axis on a shot-to-shot basis. It provides all features of our related development reported in Kiffer et al. (Rev Sci Instrum 90:113301, 2019), namely single-pass measurement of bunch length, kinetic energy and absolute charge, and is additionally designed to provide the lateral position of bunches with sub-mm accuracy. We show the setup, associated methods and provide characterizing measurements with bunches of highly charged ions in the keV regime of kinetic energy that demonstrate the capabilities and show a typical application.
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