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Updated: Jul 6, 2025

Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains
Published on: July 20, 2022
Antiferromagnetic imaging via ptychographic phase retrieval
Jizhe Cui1, Haozhi Sha1, Wenfeng Yang1
1School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China; MOE Key Laboratory of Advanced Materials, Tsinghua University, Beijing 100084, China; State Key Laboratory of New Ceramics and Fine Processing, Tsinghua University, Beijing 100084, China.
Abstract:
Antiferromagnetic imaging is critical for understanding and optimizing the properties of antiferromagnetic materials and devices. Despite the widespread use of high-energy electrons for atomic-scale imaging, they have low sensitivity to spin textures. Typically, the magnetic contribution to the phase of a high-energy electron wave is weaker than one percent of the electrostatic potential. Here, we demonstrate direct imaging of antiferromagnetic lattice through precise phase retrieval via electron ptychography, paving the way for magnetic lattice imaging of antiferromagnetic materials and devices.
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