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Angle-resolved photoelectron spectroscopy in a low-energy electron microscope.

Alexander Neuhaus1, Pascal Dreher1, Florian Schütz2

  • 1Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University of Duisburg-Essen, 47048 Duisburg, Germany.

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We enhanced spectroscopic photoemission microscopy (SPEM) with a slit for angle- and energy-resolved measurements. This improves data acquisition efficiency, crucial for advanced pump-probe microscopy techniques.

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Area of Science:

  • Surface science
  • Materials science
  • Spectroscopy

Background:

  • Spectroscopic photoemission microscopy (SPEM) is vital for studying surface electronic structures.
  • Modern SPEMs offer versatile imaging modes (image, momentum, dispersive planes) and spatial filtering capabilities.
  • Efficient energy-momentum space analysis is critical for advanced techniques like femtosecond pump-probe microscopy.

Purpose of the Study:

  • To enhance a standard spectroscopic and low-energy electron microscope (SPLEEM) with an additional slit.
  • To enable angle- and energy-resolved photoemission mode with micrometer spatial selectivity.
  • To improve the efficiency of data acquisition in energy-momentum space for advanced SPEM applications.

Main Methods:

  • Equipping a standard SPEM with an additional slit at the hemispherical analyzer entrance.
  • Implementing a photogrammetric calibration to correct for image distortions.
  • Recording benchmark spectra on Au(111) for validation.

Main Results:

  • Successful implementation of an angle- and energy-resolved photoemission mode with micrometer spatial selectivity.
  • Demonstrated correction of image distortions using photogrammetric calibration.
  • Acquired benchmark spectra on Au(111) validating the enhanced capabilities.

Conclusions:

  • The described modification enhances SPEM capabilities for detailed electronic structure analysis.
  • The improved efficiency in energy-momentum space data acquisition is essential for time-resolved studies.
  • This approach facilitates advanced laser-based pump-probe photoemission microscopy with femtosecond resolution.