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Published on: August 22, 2018
Rapid inverse radiative transfer solver for multiparameter spectrophotometry without integrating sphere.
Jiahong Jin1,2,3, Zachary D Jones2, Jun Q Lu1,2
1Hunan Institute of Science and Technology, Institute for Advanced Optics, Yueyang, China.
This study introduces a fast particle swarm optimization (PSO) solver for multiparameter spectrophotometry (MPS). It accurately retrieves radiative transfer parameters of turbid materials, enabling cost-effective material characterization.
Area of Science:
- Optical Physics
- Biomedical Optics
- Materials Science
Background:
- Multiparameter spectrophotometry (MPS) is crucial for analyzing turbid materials in diverse fields like clinical diagnosis and food safety.
- Accurate characterization of radiative transfer (RT) parameters is essential for reliable material analysis.
Purpose of the Study:
- To develop and validate a rapid inverse solver using particle swarm optimization (PSO) for retrieving RT parameters (absorption coefficient, scattering coefficient, anisotropy factor) of turbid samples.
- To enhance the efficiency and applicability of MPS for material characterization.
Main Methods:
- Monte Carlo (MC) simulations were employed to generate calculated signals for comparison with measured diffuse reflectance, diffuse transmittance, and forward transmittance.
- A novel objective function was developed and integrated with the PSO algorithm to iteratively refine MC simulations for MPS data.
- The objective function utilizes local averaging of an inverse squared error sum to minimize signal variance in the RT parameter space.
Main Results:
- The developed objective function significantly reduced variance in calculated signals.
- The RT parameters of 20% Intralipid solutions were accurately determined across a wavelength range of 520-1000 nm.
- The entire measurement and inverse calculation process averaged approximately 2.7 minutes per wavelength.
Conclusions:
- The rapid inverse solver facilitates the development of user-friendly and cost-effective MPS instruments.
- This technology enables precise material characterization by resolving compositional profiles at molecular and particulate levels without requiring an integrating sphere.
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