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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Jul 6, 2025

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Published on: February 27, 2015

Exploring in-plane interactions beside an adsorbed molecule with lateral force microscopy.

Shinjae Nam¹, Elisabeth Riegel¹, Lukas Hörmann²

¹Chair of Quantum Nanoscience, Faculty of Physics, University of Regensburg, 93053 Regensburg, Germany.

Proceedings of the National Academy of Sciences of the United States of America

|January 3, 2024

Summary

Researchers identified hydrogen atoms using lateral force microscopy by observing their repulsive signature. A metal tip

Keywords:

atomic force microscopy density functional theory in-plane interactions lateral force microscopy

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Area of Science:

Surface Science
Chemical Physics
Atomic Force Microscopy

Background:

Atomic force microscopy (AFM) with a CO-functionalized tip images molecular structures and chemical bonds.
Direct observation of hydrogen atoms is challenging due to their small size, yet they are crucial for directing surface reactions.
Previous methods struggled to resolve hydrogen atoms and their interactions in molecular systems.

Purpose of the Study:

To directly identify hydrogen atoms in planar molecules using lateral force microscopy.
To investigate the influence of tip-apex dipole on atomic force microscopy measurements.
To understand interactions governing high-resolution imaging of surface adsorbates.

Main Methods:

Lateral force microscopy (LFM) to measure in-plane interactions at the sides of PTCDA molecules.
Development and application of a model incorporating radially symmetric atomic interactions.
Density functional theory (DFT) calculations to verify electrostatic interactions and estimate tip-apex dipole strength.
Investigation of a single CO molecule as a model surface adsorbate.

Main Results:

Direct identification of hydrogen atoms via their repulsive signature in PTCDA molecules.
Observed force data anomalies attributed to the electrostatic interaction of the metal tip-apex dipole, not H-bonding.
DFT calculations confirmed the significant role of the tip-apex dipole, even in weakly polarized systems like CO.
The radially symmetric atomic interaction model was found valid over a significant solid angle (82°).

Conclusions:

Lateral force microscopy can directly image hydrogen atoms through their repulsive signature.
The metal tip-apex dipole significantly influences AFM measurements, especially at close proximity, masking direct H-bonding observations.
Understanding and accounting for tip-apex dipole effects are crucial for accurate high-resolution imaging of surface adsorbates.