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High accuracy calibration method for multi-line structured light three-dimensional scanning measurement system based

Yao Wang, Peng Zhou, Chuanwei Yao

|January 4, 2024

Summary

This summary is machine-generated.

A new multi-line laser 3D scanning system uses a diffraction grating for precise calibration, significantly improving measurement accuracy. This fast, high-accuracy system enhances 3D profile data acquisition for industrial applications.

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Area of Science:

Optical Engineering
Metrology
Computer Vision

Background:

Multi-line structured light 3D scanning offers high accuracy but current calibration methods limit its potential.
Achieving precise 3D profile data requires robust calibration of light planes.

Purpose of the Study:

To propose a fast and high-accuracy 3D measurement system using multi-line lasers and a diffraction grating.
To improve the precision of light plane calibration and enhance overall measurement accuracy.

Main Methods:

Integration of a diffraction grating to create a spatially precise structure for multi-line lasers.
Utilizing spatial constraints from diffractive light for precise calibration of light planes.
Experimental verification of the developed prototype's measurement accuracy.

Main Results:

The proposed system achieved a root mean square error (RMSE) of 0.083 mm at a 400 mm working distance.
Measurement accuracy was improved by 37.6% compared to traditional calibration methods.
The diffraction grating facilitates device integration and enhances practical application value.

Conclusions:

The developed diffraction grating-based multi-line laser 3D scanning system offers superior accuracy and efficiency.
This approach overcomes limitations of current calibration techniques, enabling richer 3D data acquisition.
The system demonstrates significant potential for industrial 3D measurement applications.