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Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry
Published on: March 4, 2021
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Atomic surface achieved through a novel cross-scale model from macroscale to nanoscale.
Feng Zhao1, Zhenyu Zhang1, Xingqiao Deng2
1State Key Laboratory of High-performance Precision Manufacturing, Dalian University of Technology, Dalian 116024, China. zzy@dlut.edu.cn.
Nanoscale
|January 4, 2024
Summary
A new green chemical mechanical polishing (CMP) process and cross-scale model were developed to understand atomic surface polishing. This research offers insights into novel polishing slurries and pads for improved material removal and reduced environmental impact.
Area of Science:
- Materials Science and Engineering
- Surface Science
- Chemical Engineering
Background:
- Chemical mechanical polishing (CMP) is crucial for achieving atomic-level surface smoothness in various applications.
- Traditional CMP methods often utilize hazardous slurries, posing environmental risks and limiting process sustainability.
- The intricate cross-scale mechanisms governing CMP, from macro to nano levels, remain poorly understood.
Purpose of the Study:
- To develop a novel green CMP process and an integrated cross-scale polishing model.
- To elucidate the fundamental mechanisms of material removal during CMP across different scales.
- To provide a foundation for designing environmentally friendly CMP slurries, pads, and equipment.
Main Methods:
- Development of a green CMP slurry using hydrogen peroxide, sodium carbonate, sodium hydroxycellulose, and silica.
- Integration of Eulerian and Lagrangian models with reactive force field-molecular dynamics for cross-scale modeling.
- Experimental validation of the proposed model using fused silica polished with a ceria slurry.
Main Results:
- The green CMP process achieved a surface roughness (Sa) of 0.126 nm, a material removal rate of 88.3 nm/min, and a damaged layer thickness of 8.8 nm.
- The cross-scale model accurately predicted experimental CMP outcomes, revealing stress distributions within the polishing pad fibers and abrasive-workpiece interface.
- Increased slurry viscosity was shown to enhance stress, facilitating material removal, while compressive stress influenced the material removal form from atomic to molecular chains.
Conclusions:
- The developed green CMP process and cross-scale model offer significant advancements in understanding and optimizing polishing mechanisms.
- The findings pave the way for the design of sustainable CMP technologies with improved efficiency and reduced environmental impact.
- This research provides critical insights for the future development of novel polishing materials and processes.

