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Updated: Jul 6, 2025

Fabrication and Characterization of Thickness Mode Piezoelectric Devices for Atomization and Acoustofluidics
Published on: August 5, 2020
Microfabrication of piezoelectric MEMS based on thick LiNbO3single-crystal films
Merieme Ouhabaz1, Djaffar Belharet1, Quentin Micard1
1FEMTO-ST Institute, University of Franche-Comté, CNRS (UMR 6174), ENSMM, 26 rue de l'Epitaphe, F-25000 Besançon, France.
Abstract:
Microfabrication procedure of piezoelectric micro electro-mechanical systems based on 5μm thick LiNbO3films on SiO2/Si substrate at wafer scale including deep dry etching of thick LiNbO3films by implementing pulsed mode of Ar/SF6gas was developed. In particular, two (YXlt)/128°/90°LiNbO3-Si cantilevers with tip mass were fabricated and characterized in terms of resonance frequency (511 and 817 Hz), actuation and acceleration sensing capabilities. The quality factor of 89.5 and the electromechanical coupling of 4.8% were estimated from measured frequency dependency of electrical impedance, fitted by using Butterworth-Van Dyke model. The fabricated piezoelectric micro-electro-mechanical systems have demonstrated highly linear displacement with good sensitivity (5.28 ± 0.02μm V-1) as a function of applied voltage and high sensitivity to vibrations of 667 mV g-1indicating a suitability of the structure for actuation purposes and for acceleration or frequency sensing with high precision, respectively.

