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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on: April 18, 2019

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Calculating effective carrier lifetimes in semiconductor crystals under realistic conditions

    Nature Computational Science
    |January 4, 2024
    PubMed
    Abstract

    No abstract available in PubMed .

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