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Updated: Jul 6, 2025

A Machine Learning Approach to Design an Efficient Selective Screening of Mild Cognitive Impairment
Published on: January 11, 2020
Supervised diagnostic classification of cognitive attributes using data augmentation
Ji-Young Yoon1, Gahgene Gweon2, Yun Joo Yoo1
1Department of Mathematics Education, Seoul National University, Seoul, South Korea.
This study introduces a supervised diagnostic classification model with data augmentation (SDCM-DA) to improve student cognitive state diagnosis in educational assessments. Data augmentation significantly boosts classification accuracy, even with limited or imperfect expert labels.
Area of Science:
- Artificial Intelligence
- Educational Measurement
- Machine Learning
Background:
- Machine learning (ML) offers data-driven decision-making across sectors, including educational assessment.
- Diagnostic Classification Models (DCMs) diagnose student cognitive states but face challenges with latent, unlabeled data.
- Existing ML applications in DCMs often rely on small, expert-labeled datasets.
Purpose of the Study:
- To propose a supervised diagnostic classification model with data augmentation (SDCM-DA).
- To enhance the classification accuracy of students' cognitive states in educational assessments.
- To address the challenge of limited labeled data in applying ML to DCMs.
Main Methods:
- Developed a supervised diagnostic classification model with data augmentation (SDCM-DA).
- Constructed a data generation model using probabilities of correct responses from expert-labeled data.
- Conducted a simulation study comparing SDCM-DA with traditional methods using only expert-labeled data.
Main Results:
- Data augmentation substantially improved classification accuracy.
- Enhanced performance was observed even with small, error-prone labeled samples.
- Effective student classification was achieved without needing an explicit underlying response model.
Conclusions:
- SDCM-DA effectively leverages augmented data to improve diagnostic classification.
- The method is robust to limited and imperfect expert labels and lower-quality test items.
- This approach advances ML applications in educational assessment by overcoming data limitations.
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