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Updated: Jul 6, 2025

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
06:58

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

9.6K

Point field emission electron source with a magnetically focused electron beam

Paweł Urbański1, Piotr Szyszka1, Marcin Białas1

  • 1Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, 11/17 Janiszewski St., 50-372 Wrocław, Poland.

Ultramicroscopy
|January 5, 2024
PubMed

Keywords:
Electrostatic focusingField electron sourceMEMSMagnetic focusing

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