Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Transmission Electron Microscopy01:15

Transmission Electron Microscopy

5.5K
In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
5.5K
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

9.2K
The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
9.2K
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

4.2K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
4.2K
Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle01:19

Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle

626
Inductively coupled plasma (ICP) is the most widely used plasma source in atomic emission spectroscopy (AES), also known as Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES). The ICP source, or torch, consists of three concentric quartz tubes with argon gas flowing through them. A spark from a Tesla coil initiates the ionization of argon, generating a high-temperature plasma.
The ions and electrons produced interact with the fluctuating magnetic field created by a water-cooled...
626
Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

2.2K
Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
2.2K
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

486
The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
486

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Lifestyle interventions and 24-hour movement behaviors in preschool children: a systematic review and meta-analysis.

Frontiers in public health·2026
Same author

Wuqinxi exercise for mind and balance: Enhancing cognition, fall prevention, and quality of life in older adults with mild cognitive impairment.

PloS one·2026
Same author

Smart sensors, smarter players: The role of real-time monitoring in football training.

PloS one·2025
Same author

Microgravity-induced wet chemical etching of borosilicate glass enhances the process rate.

Scientific reports·2025
Same author

Time-course effects of cognitively engaging physical activity on executive function and self-control in younger school-aged children: a randomized controlled trial.

Frontiers in psychology·2025
Same author

Effects of ball combination training program combined with cTBS intervention on motor disorder in children with autism spectrum disorder.

Scientific reports·2025

Related Experiment Video

Updated: Jul 6, 2025

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
06:58

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

9.6K

Point field emission electron source with a magnetically focused electron beam.

Paweł Urbański1, Piotr Szyszka1, Marcin Białas1

  • 1Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, 11/17 Janiszewski St., 50-372 Wrocław, Poland.

Ultramicroscopy
|January 5, 2024
PubMed
Summary

This study introduces a novel carbon nanotube field emitter for high-current electron beams. This silicon-based electron source is ideal for microelectromechanical systems (MEMS) X-ray and electron microscopes.

Keywords:
Electrostatic focusingField electron sourceMEMSMagnetic focusing

More Related Videos

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

11.0K
Preparing a Celadonite Electron Source and Estimating Its Brightness
09:14

Preparing a Celadonite Electron Source and Estimating Its Brightness

Published on: November 5, 2019

4.6K

Related Experiment Videos

Last Updated: Jul 6, 2025

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
06:58

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

9.6K
Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

11.0K
Preparing a Celadonite Electron Source and Estimating Its Brightness
09:14

Preparing a Celadonite Electron Source and Estimating Its Brightness

Published on: November 5, 2019

4.6K

Area of Science:

  • Materials Science
  • Physics
  • Nanotechnology

Background:

  • Electron sources are crucial for microelectronics and MEMS devices.
  • Miniaturized electron sources are needed for advanced applications like MEMS X-ray and electron microscopes.
  • Current electron sources face limitations in current output and beam quality.

Purpose of the Study:

  • To develop a novel field emitter for high-performance electron beam generation.
  • To integrate carbon nanotubes with silicon tips for enhanced field emission.
  • To investigate the focusing capabilities using combined electrostatic and magnetic fields.

Main Methods:

  • Fabrication of a silicon tip field emitter coated with carbon nanotubes.
  • Implementation of a focusing system comprising two electrostatic lenses and a magnetic field.
  • Characterization of the field emitter's performance, including emission current and beam spot characteristics.

Main Results:

  • The field emitter achieved a high emission current of approximately 50 µA.
  • The electron beam was successfully focused to a small and homogeneous spot.
  • The combined electrostatic and magnetic focusing proved effective for beam control.

Conclusions:

  • The developed carbon nanotube field emitter demonstrates significant potential for microelectronics and MEMS applications.
  • This technology offers a promising solution for next-generation MEMS X-ray sources and electron microscopes.
  • The novel focusing method enhances the utility of such electron sources.