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Beam induced mass loss in high resolution biological microanalysis.
Journal of Microscopy
|December 1, 1986
Summary
Electron beam irradiation causes significant mass loss in biological samples, particularly affecting sulfur content. Lowering the temperature during electron microscopy greatly reduces this beam damage and sulfur loss.
Area of Science:
- Materials Science
- Biological Sciences
- Analytical Chemistry
Background:
- Electron beam microscopy is crucial for analyzing biological samples.
- Electron beam irradiation can induce mass loss, affecting analytical accuracy.
- Understanding beam-induced damage is essential for reliable results.
Purpose of the Study:
- To quantify electron beam induced mass loss in biological samples.
- To investigate the impact of temperature on beam damage.
- To assess the loss of specific elements like sulfur.
Main Methods:
- Utilized Energy-Dispersive X-ray Spectroscopy (EDS) to monitor spectral changes.
- Measured bremsstrahlung and elemental peak variations under electron beam exposure.
- Corrected for experimental artifacts like contamination and drift.
- Compared results at room temperature (296 K) and low temperature (93 K).
Main Results:
- Significant mass loss observed in organic matrix and higher Z elements.
- Average bremsstrahlung losses were 45-50% for different sample types.
- Average sulfur losses ranged from 72-86%.
- Low-temperature (93 K) irradiation initiated damage at higher doses, with reduced sulfur loss.
Conclusions:
- Electron beam irradiation causes substantial mass loss in biological samples, especially sulfur.
- Temperature plays a critical role in mitigating beam-induced damage.
- Low-temperature microscopy is recommended for preserving sample integrity and improving analytical accuracy.