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Simultaneous Measurement of Group Refractive Index Dispersion and Thickness of Fused Silica Using a Scanning White

Heesu Lee1, Seungjin Hwang2, Hong Jin Kong3,4

  • 1Department of Computer Science and Electrical Engineering, Handong Global University, Pohang 37554, Republic of Korea.

Sensors (Basel, Switzerland)
|January 11, 2024
PubMed

Keywords:
fused silicagroup refractive index dispersionscanning white light interferometerthicknesswhite light interferometer

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