Simultaneous Visualization of Microscopic Conductivity and Deformation in Conductive Elastomers

Xiaobin Liang1, Haonan Liu1, So Fujinami2

  • 1Department of Chemical Science and Engineering, School of Materials and Chemical Technology, Tokyo Institute of Technology, Ookayama 2-12-1, Meguro-ku, Tokyo 152-8550, Japan.

ACS Nano
|January 15, 2024
PubMed
Summary

Researchers developed a new method combining atomic force microscopy (AFM) techniques to visualize how conductive elastomers deform and conduct electricity at the nanoscale. This helps understand material behavior and improve design.

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