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Updated: Jul 5, 2025

A Method for Obtaining Serial Ultrathin Sections of Microorganisms in Transmission Electron Microscopy
Published on: January 17, 2018
Depth sectioning using environmental and atomic-resolution STEM
Masaki Takeguchi1, Ayako Hashimoto1, Kazutaka Mitsuishi1
1Center for Basic Research on Materials, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan.
Abstract:
(Scanning) transmission electron microscopy (TEM) images of samples in gas and liquid media are acquired with an environmental cell (EC) via silicon nitride membranes. The ratio of sample signal against the background is a significant factor for resolution. Depth-sectioning scanning TEM (STEM) is a promising technique that enhances the signal for a sample embedded in a matrix. It can increase the resolution to the atomic level, thereby enabling EC-STEM applications in important areas. This review introduces depth-sectioning STEM and its applications to high-resolution EC-STEM imaging of samples in gases and in liquids.
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