A Flexible Printed Circuit Board Based Microelectromechanical Field Mill with a Vertical Movement Shutter Driven by...

Micromachined electric field mills have received much interest for the measurement of DC fields; however, conventional designs with lateral moving shutters could have shutter lifting in the presence of strong fields, which affects their performance. This paper presents a MEMS electric field mill utilizing a vertical movement shutter to address this issue. The sensor is designed and fabricated based on a flexible PCB substrate and is released using a laser-cutting process. The movement of the shutter is driven by an electrostatic actuator. When the driving signal is a sine wave, the shutter moves in the same direction during both the positive and negative half-periods. This facilitates the application of a lock-in amplifier to synchronize with the signal at twice the frequency of the driving signal. In experimental testing, when the vertical shutter is driven at a resonance of 840 Hz, the highest sensitivity of the sensor is achieved and is measured to be 5.1 V/kVm^-1. The sensor also demonstrates a good linearity of 1.1% for measuring DC electric fields in the range of 1.25 kV/m to 25 kV/m.