Synthesis and Characterization of Type II Ge-Si Clathrate Films for Optoelectronic Applications

Type II inorganic clathrates consist of cage-like structures with open frameworks, and they are considered promising materials due to their unique properties. However, the difficulty of synthesizing phase-pure and continuous films has hindered their application in practical devices. In this report, we demonstrate the synthesis of type II SiGe clathrate films through the thermal decomposition of a Na-deposited amorphous SiGe film on a sapphire substrate in a high vacuum. The as-prepared films of type II SiGe clathrates showed uniform growth and were evaluated for their structural and optical properties. Morphological studies conducted using a scanning electron microscope showed the presence of cracks on the film surface.