Related Experiment Video
Updated: Jul 4, 2025

Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy
Published on: August 10, 2019
Unsupervised machine learning combined with 4D scanning transmission electron microscopy for bimodal nanostructural
Koji Kimoto1, Jun Kikkawa2, Koji Harano2
1Center for Basic Research On Materials, National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan. kimoto.koji@nims.go.jp.
Unsupervised machine learning combined with four-dimensional scanning transmission electron microscopy (4D-STEM) allows detailed analysis of crystal structures at the nanoscale. This approach successfully identified nanoscale precipitates in metallic glass, overcoming limitations of conventional methods.
Area of Science:
- Materials Science
- Data Science
- Nanotechnology
Background:
- Scanning transmission electron microscopy (STEM) provides high spatial resolution for material analysis.
- Analyzing large datasets from techniques like four-dimensional STEM (4D-STEM) presents computational challenges.
- Unsupervised machine learning offers powerful tools for extracting meaningful information from complex data.
Purpose of the Study:
- To combine unsupervised machine learning with 4D-STEM for advanced crystal structure analysis.
- To develop optimized machine learning methods for processing large-scale 4D-STEM data.
- To apply these integrated techniques for characterizing nanostructures in materials.
Main Methods:
- Utilized unsupervised machine learning techniques, including non-negative matrix factorization (NMF) and hierarchical clustering.
- Developed custom software for data preprocessing, NMF, and hierarchical clustering tailored for electron diffraction and STEM imaging.
- Implemented hierarchical clustering with cross-correlation for rotation- and shift-corrected analysis.
Main Results:
- Successfully processed large-scale 4D-STEM data using dimensionality reduction techniques.
- Identified nanoscale crystalline precipitates (approx. 7 nm) within an amorphous matrix of Zr-Cu-Al metallic glass.
- Achieved detection of precipitates that were difficult to resolve with conventional STEM methods.
Conclusions:
- The integration of 4D-STEM with optimized unsupervised machine learning enables comprehensive bimodal analysis of material nanostructures.
- This approach enhances the capability for detailed crystal structure analysis at the nanometer scale.
- The developed methodology provides a powerful tool for materials characterization, particularly for complex systems like metallic glasses.
More Related Videos
Related Concept Videos
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Overview of Electron Microscopy

