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Updated: Jul 4, 2025

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Reply to the 'Comment on "A single level tunneling model for molecular junctions: evaluating the simulation methods"'
Zheyang Li1,2, Xi Yu1,2
1Tianjin Key Laboratory of Molecular Optoelectronic Science, School of Science, Tianjin University, Tianjin 300072, China. xi.yu@tju.edu.cn.
Abstract:
We respond to the recent comment by Dr. Ion Bâldea concerning our work, "A single level tunneling model for molecular junctions: evaluating the simulation methods [E. M. Opodi et al.,Phys. Chem. Chem. Phys., 2022, 24, 11958]". Dr. Bâldea has raised concerns about the applicability map we developed based on the comparison study of the 3 analytical models used in the study of molecular electronics. In our response, we have dissected Dr. Bâldea's critique into four primary points. For each, we have provided comprehensive replies that address and rectify the misinterpretations of our initial study. We'd like to thank Dr. Ion Bâldea for his comments, which have resulted in further clarification of the applicability of the analytical models for the study of molecular electronics.
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