Robust Energy Storage Property of La-Doped PZT Films Within a Wide Temperature Range
Xiaojun Qiao1, Huiyi Zhang2, Tao Guo2
1Science and Technology on Electronic Test and Measurement Laboratory, School of Semiconductor and Physics, North University of China, Taiyuan 030051, China.
Abstract:
Antiferroelectric (AFE) films have received a lot of attention for their high energy storage density and temperature stability, giving them potential in electrostatic energy storage devices. In this work, La-doped PZT AFE films were prepared through a sol-gel procedure, and energy storage properties within a wide temperature range (73-533 K) were explored. Typical dipoles rotate in one direction along electric fields, combined with phase transition behavior. The polarization behavior is modulated by both electric field and temperature. With increasing temperature, the saturation polarization strength decreases due to the phase transition from the AFE state to the ferroelectric state. Besides, the temperature dependence of electrical properties was investigated, and the energy storage density of Pb0.97La0.02(Zr0.95Ti0.05)O3 films was about 5.84 J/cm3 in the low temperature range (<273.15 K). All results indicate the great potential of AFE films in pulse power device applications, especially in low-temperature ranges.
Related Concept Videos
The Resting Membrane Potential
Energy Stored in a Capacitor
Energy Stored in Capacitors
By integrating the equation that relates voltage and current in a capacitor, one can derive an equation for the voltage across the capacitor at any given time. This equation is crucial in understanding and predicting the behavior of capacitors in...
P-N junction


